This inventor holds 2 USPTO granted patents. Top assignee: National Science Council. Active years: 2001-2002.
Company Filing History:
Years Active: 2001-2002
Title: Solomon J H Lee: Innovator in Optical Measurement Technologies
Introduction
Solomon J H Lee is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of optical measurement technologies, holding 2 patents that showcase his innovative spirit and technical expertise.
Latest Patents
His latest patents include a device for measuring the complex refractive index and thin film thickness of a sample, specifically an ellipsometer. This ellipsometer is designed to measure the complex refractive index of a sample and the thickness of thin films. It incorporates a linear polarized light source, a reference analyzer, a polarization analyzer, and a light direction controller. The system generates a measuring beam to detect the sample, with a phase modulator controlling the phase of the measuring beam to create a sampling beam. The reference analyzer adjusts the intensity of the sampling beam, while the polarization analyzer analyzes the phase, polarization, and intensity of the reflected sampling beam. The light direction controller manages the angle and direction of the sampling beam, ensuring accurate measurements.
Another notable patent is an optical mechanism for precisely controlling the angle of an incident light beam within a large incident angle range. This invention features an optical path overlapping type incident angle changeable optical mechanism that allows an incident light beam to be directed onto a sample within a broad range of angles. The mechanism includes a reflecting prism, a concave parabolic cylindric mirror, and a concave cylindric mirror, all working together to ensure that the detect-waiting light beam overlaps with the incident light beam.
Career Highlights
Solomon J H Lee is affiliated with the National Science Council, where he continues to advance research in optical technologies. His work has been instrumental in developing innovative solutions that enhance measurement accuracy in various applications.
Collaborations
He collaborates with esteemed colleagues, including Chih-Kung Lee and Shu-Sheng Lee, contributing to a dynamic research environment that fosters innovation and discovery.
Conclusion
Solomon J H Lee's contributions to optical measurement technologies reflect his dedication to innovation and excellence. His patents not only advance scientific understanding but also pave the way for future developments in the field.