The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2001
Filed:
Dec. 30, 1999
Solomon J. H. Lee, Taipei, TW;
Chih-Kung Lee, Taipei, TW;
Tony C. H. Lin, Taipei, TW;
Shih-Jui Chen, Taipei, TW;
Shu-Sheng Lee, Taipei, TW;
Shuen-Chen Shiue, Keelung, TW;
National Science Council, Taipei, TW;
Abstract
An optical path overlapping type incident angle changeable optical mechanism according to the invention allows an incident light beam to be incident onto a measured range of a sample within a large incident angle range. The optical mechanism includes a reflecting prism reflecting the incident light beam to generate a reflected light beam having an angle of 90° with respect to the incident light beam; a concave parabolic cylindric mirror guiding the reflected light beam coming from the reflecting prism to a measured range of a detect-waiting sample to thereby be further reflected to generate a detect-waiting light beam; a concave cylindric mirror used to make the detect-waiting light beam incident onto/reflected by the reflecting prism so as to overlap with the incident light beam; and a light beam splitting means used to separate the detect-waiting light beam from the incident light beam.