Donzdorf, Germany

Siegfried Wahl

This inventor holds 31 USPTO granted patents and 7 published patent applications, plus 3 CIPO patents and 37 EPO patents, primarily in Optometry Devices. Top assignees: Carl Zeiss Vision International Gmbh, Carl Zeiss Ag, Carl Zeiss Smt Gmbh. Active years: 2008-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Siegfried Wahl. Retrieved from https://idiyas.com/inventor/siegfried-wahl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 31 

% Patents Active = 96.8


 

Average Co-Inventor Count = 3.2

ph-index = 3

Forward Citations = 21(Granted Patents)


Company Filing History:


Years Active: 2008-2026

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Areas of Expertise:
Refractive Error
Optometry Device
Visual Performance
Spectacle Lens
Ocular Aberration
Contrast Sensitivity
Optical Parameter
Neural Transfer Function
Accommodation
Heterotropia
Head Movements
Optical Aid
31 patents (USPTO):Explore Patents

Title: Siegfried Wahl: Pioneering Inventor from Donzdorf

Introduction: Siegfried Wahl is a renowned inventor hailing from Donzdorf, Germany, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Siegfried Wahl holds several patents in various technological domains, including advancements in renewable energy systems, smart home devices, and medical equipment.

Career Highlights: Throughout his illustrious career, Siegfried Wahl has worked with leading tech companies to develop cutting-edge solutions that have revolutionized industries and improved the quality of life for many.

Collaborations: Siegfried Wahl has collaborated with top researchers, engineers, and scientists from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Siegfried Wahl's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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