The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2024
Filed:
Dec. 20, 2022
Carl Zeiss Vision International Gmbh, Aalen, DE;
Nikolai Suchkov, Kusterdingen, DE;
Siegfried Wahl, Donzdorf, DE;
Carl Zeiss Vision International GmbH, Aalen, DE;
Abstract
A device and a method for determining an ocular aberration of at least one eye of a user are disclosed. The device contains a wavefront sensing unit for measuring at least one optical wavefront with at least one light beam, from which an ocular aberration of the at least one eye of the user is determined. The device further contains at least one diffractive element for generating multiple diffraction orders in the light beam in two meridians in a manner that the multiple diffraction orders are spatially separated on the wavefront sensing unit and in the eye of the user. The device and the method allow generating an ocular defocus map in a one-shot assessment in real-time, especially by employing an automated measurement of the ocular aberrations with regard to different eccentricities of the eye of the user in two meridians.