This inventor holds 2 USPTO granted patents. Top assignee: Adv Antest Corporation. Active years: 2021.
Company Filing History:
Years Active: 2021
Title: Innovations by Shuichi Inage
Introduction
Shuichi Inage is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of testing apparatuses and systems, particularly for wireless devices. With a total of two patents to his name, Inage's work showcases his expertise and innovative thinking.
Latest Patents
Inage's latest patents include a "Test Apparatus and Test Method" and a "Test System." The test apparatus is designed to evaluate a device under test (DUT) that does not support synchronous control from an external circuit. It features a main controller that operates as the master for synchronous control. An interface, known as the MIU, facilitates asynchronous control with the DUT as the master while maintaining control with the main controller. The test system is specifically tailored for wireless devices, incorporating a golden device for bidirectional communication with the DUT. It includes a measurement device that captures signals from the DUT and an interface unit that monitors additional signals, generating trigger signals for data acquisition.
Career Highlights
Shuichi Inage is currently employed at Advantest Corporation, where he continues to develop innovative testing solutions. His work has been instrumental in advancing the capabilities of testing systems for modern wireless technologies.
Collaborations
Inage collaborates with talented colleagues such as Kazuhiro Iezumi and Tomoyuki Itakura. Their combined expertise contributes to the success of their projects and the advancement of testing technologies.
Conclusion
Shuichi Inage's contributions to the field of testing apparatuses and systems highlight his innovative spirit and dedication to advancing technology. His patents reflect a deep understanding of the challenges faced in testing wireless devices, making him a valuable figure in the industry.