The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 06, 2021

Filed:

Sep. 24, 2019
Applicant:

Advantest Corporation, Tokyo, JP;

Inventors:

Yoshiyuki Aoki, Tokyo, JP;

Kazuhiro Iezumi, Tokyo, JP;

Tomoyuki Itakura, Tokyo, JP;

Shuichi Inage, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01); H04W 24/08 (2009.01); H04W 4/80 (2018.01); H04W 84/12 (2009.01);
U.S. Cl.
CPC ...
H04L 43/50 (2013.01); H04W 24/08 (2013.01); H04W 4/80 (2018.02); H04W 84/12 (2013.01);
Abstract

A test system tests a DUT configured as a wireless device. A golden device is configured to provide bidirectional communication between it and the DUT. A measurement device acquires a first signal Sincluding at least an output Sof the DUT. An interface unit monitors a second signal Sincluding at least one of the output Sof the golden device and the output Sof the DUT. In response to the occurrence of a predetermined waveform pattern in the second signal, the interface unit generates a trigger signal TRIG for instructing the measurement device to acquire a signal.


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