The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 05, 2021
Filed:
Sep. 24, 2019
Advantest Corporation, Tokyo, JP;
Shuichi Inage, Tokyo, JP;
Kazuhiro Iezumi, Tokyo, JP;
Tomoyuki Itakura, Tokyo, JP;
Keisuke Kusunoki, Tokyo, JP;
Yoshihiro Kato, Tokyo, JP;
Kazuhiro Tsujikawa, Tokyo, JP;
Naoya Kimura, Tokyo, JP;
Yuki Watanabe, Tokyo, JP;
Yuichiro Harada, Tokyo, JP;
Koji Miyauchi, Tokyo, JP;
ADVANTEST CORPORATION, Tokyo, JP;
Abstract
A test apparatus is configured to test a DUT that does not support synchronous control from an external circuit. A main controller is configured based on an architecture that tests a device by synchronous control with the main controller itself as the master. A MIU is configured as an interface between the main controller and the DUT. The MIU establishes asynchronous control between it and the DUT with the DUT as the master, and establishes control between it and the main controller with the main controller as the master.