Location History:
- Konosu, JP (2009 - 2012)
- Hitachinaka, JP (2012 - 2013)
- Kounosu, JP (2002 - 2014)
Company Filing History:
20 out of 2,874 
6 out of 42,496 
1 out of 832,843 Years Active: 2002-2014
Title: Shuichi Chikamatsu: Innovator in Defect Inspection Technology
Introduction
Shuichi Chikamatsu, a prominent inventor from Kounosu, Japan, is known for his significant contributions to the field of defect inspection technology. With a remarkable portfolio of 21 patents, he has been at the forefront of innovations that enhance the sensitivity and efficiency of defect detection systems.
Latest Patents
Among Chikamatsu's latest inventions, the **Defect Inspection System** stands out. This system effectively suppresses the effects of light from rough surfaces and circuit patterns, consequently increasing the gain of light from defects. This innovation allows for the detection of defects with heightened sensitivity. It incorporates a lens with a large numerical aperture (NA) to receive light from the defects at a reduced elevation angle, minimizing scattered light while maximizing the detection capability.
Another notable patent is the **Inspection Apparatus and Inspection Method**, which emits light onto a test object and detects any reflected or scattered light to identify defects. This apparatus features a temperature-controlled part accommodating section that manages parts requiring temperature regulation, thereby enhancing the efficiency of the temperature control system without increasing the apparatus size.
Career Highlights
Shuichi Chikamatsu has made significant strides in his career, working with notable companies such as Hitachi High Technologies Corporation and Hitachi, Ltd. His expertise has allowed him to be a pivotal figure in developing technologies that have transformed defect inspection processes.
Collaborations
Throughout his career, Chikamatsu has collaborated with distinguished colleagues, including Minori Noguchi and Kenji Aiko. These partnerships have facilitated the exchange of ideas and fostered an environment of innovation that has been critical to their collective success.
Conclusion
In conclusion, Shuichi Chikamatsu has established himself as a leading innovator in defect inspection technology. His array of patents reflects his commitment to advancing the field, ensuring that defect detection methods are more efficient and effective. As technology continues to evolve, Chikamatsu's contributions will undoubtedly remain influential.