Company Filing History:
Years Active: 2016-2017
Title: Shuhong Liu: Innovator in Inline Inspection Technologies
Introduction
Shuhong Liu is a prominent inventor based in Chandler, AZ (US), known for his contributions to the field of inline inspection technologies. With a total of 4 patents, Liu has made significant advancements in the detection of hidden defects in conductive traces and molding materials.
Latest Patents
One of Liu's latest patents focuses on the inline inspection of the contact between conductive traces and substrates for hidden defects using a white light interferometer with a tilted objective lens. This invention includes devices, systems, and processes that utilize a white light interferometer (WLI) microscope to monitor resist footing defects and conductive trace undercut defects. The technology allows for high-throughput and low-cost metrology, enabling non-destructive, non-contact, inline monitoring of defects that may otherwise go undetected.
Another notable patent involves the inline measurement of molding material thickness using terahertz reflectance. This method includes emitting a terahertz beam from a light source at a layer of molding material and detecting the reflectance of the beam to determine the thickness of the layer. The system is designed to support a panel with multiple substrates and accurately measure material thickness based on the time delay of the emitted terahertz beam.
Career Highlights
Shuhong Liu is currently employed at Intel Corporation, where he continues to innovate and develop cutting-edge technologies. His work has significantly impacted the field of materials inspection and quality control in manufacturing processes.
Collaborations
Liu collaborates with notable colleagues, including Zhiyong Wang and Nilanjan Z Ghosh, who contribute to his research and development efforts.
Conclusion
Shuhong Liu's innovative work in inline inspection technologies has led to significant advancements in the detection of hidden defects, enhancing the quality and reliability of manufacturing processes. His contributions continue to shape the future of materials inspection in the industry.