This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Tokyo Electron Limited. Active years: 2022-2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022-2025
Title: Shinya Kurebayashi: Innovator in Device Inspection Technology
Introduction
Shinya Kurebayashi is a notable inventor based in Nirasaki, Japan. He has made significant contributions to the field of device inspection technology, holding a total of 2 patents. His work focuses on improving the efficiency and accuracy of inspection processes in electronic devices.
Latest Patents
Kurebayashi's latest patents include a device inspection apparatus and a temperature measurement member. The device inspection apparatus features a voltage source that applies voltage to the device under inspection. It includes a series of resistors, a detector for measuring potential differences, and a controller that manages the detection process. This innovative design allows for the detection of potential differences across multiple resistor groups in a systematic manner.
The temperature measurement member is designed to measure the temperature of an inspection object or the mounting table within an inspection apparatus. It is attached to a probe card used for electrical characteristic inspection. This member includes a temperature sensor that transmits temperature measurement signals to the inspection part, enhancing the overall inspection process.
Career Highlights
Shinya Kurebayashi is associated with Tokyo Electron Limited, a leading company in the semiconductor and electronics industry. His work at the company has been instrumental in advancing inspection technologies that are critical for ensuring the quality and reliability of electronic devices.
Collaborations
Kurebayashi has collaborated with notable coworkers such as Jun Mochizuki and Miyoko Kuroda. Their combined expertise has contributed to the development of innovative solutions in the field of device inspection.
Conclusion
Shinya Kurebayashi's contributions to device inspection technology reflect his commitment to innovation and excellence. His patents demonstrate a deep understanding of the complexities involved in electronic device inspection, making him a valuable figure in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile