The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2022

Filed:

Dec. 19, 2019
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Yoshihito Yamasaki, Singapore, SG;

Shinya Kurebayashi, Nirasaki, JP;

Jun Mochizuki, Nirasaki, JP;

Miyoko Kuroda, Nirasaki, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01K 13/00 (2021.01); G01R 31/26 (2020.01); G01K 7/00 (2006.01); G01R 1/073 (2006.01); G01K 1/14 (2021.01); G01R 31/28 (2006.01); G01K 11/00 (2006.01); G01K 7/18 (2006.01);
U.S. Cl.
CPC ...
G01K 13/00 (2013.01); G01K 1/14 (2013.01); G01K 7/00 (2013.01); G01R 1/07342 (2013.01); G01R 31/002 (2013.01); G01R 31/26 (2013.01); G01R 31/2601 (2013.01); G01R 31/2621 (2013.01); G01R 31/2834 (2013.01); G01R 31/2851 (2013.01); G01R 31/2874 (2013.01); G01R 31/2887 (2013.01); G01R 31/2891 (2013.01); G01K 7/18 (2013.01); G01K 11/00 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48145 (2013.01); H01L 2924/00 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A temperature measurement member measures a temperature of an inspection object or a temperature of a mounting table on which the inspection object is placed inside an inspection apparatus that inspects the inspection object. The temperature measurement member is attached to an attachment position of a probe card used for electrical characteristic inspection in the inspection apparatus, and includes a main body having substantially a same shape as the probe card; a probe formed to extend from the main body toward the mounting table in a state in which the temperature measurement member is attached to the attachment position; and a temperature sensor configured to measure the temperature of the inspection object or the mounting table. The sensor transmits/receives a temperature measurement-related electrical signal to/from an inspection part via the probe card in the electrical characteristic inspection, and transmits a temperature measurement result to the inspection part.


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