Osaka, Japan

Shinji Sugita

USPTO Granted Patents = 11 

 

Average Co-Inventor Count = 2.9

ph-index = 3

Forward Citations = 22(Granted Patents)


Location History:

  • Yamatokoriyama, JP (2001)
  • Ikoma, JP (2007)
  • Nara, JP (2008 - 2013)
  • Osaka, JP (2013 - 2015)
  • Kyoto, JP (2018 - 2020)

Company Filing History:


Years Active: 2001-2020

Loading Chart...
Loading Chart...
11 patents (USPTO):Explore Patents

Title: Shinji Sugita: Innovator in X-ray Inspection Technology

Introduction: Shinji Sugita, an accomplished inventor based in Osaka, Japan, is renowned for his significant contributions to the field of X-ray inspection technology. With an impressive portfolio of 11 patents, Sugita stands out as a pioneer in developing innovative solutions that enhance the efficiency and effectiveness of X-ray inspection processes.

Latest Patents: Among his latest innovations, Sugita has developed advanced X-ray inspection apparatuses and methods. One notable patent includes an X-ray inspection apparatus that features a motor-driven stage for moving inspection objects, an X-ray source, and an X-ray camera. This apparatus includes a position detection unit that periodically obtains and stores motor position data, enabling precise imaging. Additionally, a reconstruction unit utilizes captured image data along with relative position calculations to enhance the inspection outcomes. Another patent outlines an inspection apparatus comprising a feed-in preparation chamber, an imaging chamber, and a feed-out preparation chamber, designed to streamline the imaging process while ensuring protection against radioactive interference.

Career Highlights: Sugita's career showcases his profound expertise and leadership in technological innovation. He has worked with prominent companies such as Sharp Corporation and Omron Corporation, where he honed his skills and contributed to the advancement of inspection technologies. His role in both organizations has been integral in driving innovation forward in their respective product lines.

Collaborations: Throughout his career, Sugita has collaborated with talented professionals, including colleagues like Takako Onishi and Yuhi Akagawa. These partnerships have fostered a creative environment that stimulates inventive thinking and problem-solving, leading to the development of groundbreaking technologies in the inspection domain.

Conclusion: Shinji Sugita exemplifies the essence of innovation in X-ray inspection technology. With his extensive patent portfolio and collaboration with leading companies and professionals, he continues to shape the future of inspection methodologies. His dedication to enhancing inspection processes through innovative solutions underscores the impact that one inventor can have on technology and industry.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…