The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
Aug. 28, 2009
Shinji Sugita, Nara, JP;
Noriyuki Kato, Kyotanabe, JP;
Masayuki Masuda, Nishinomiya, JP;
Tsuyoshi Matsunami, Kyotanabe, JP;
Shinji Sugita, Nara, JP;
Noriyuki Kato, Kyotanabe, JP;
Masayuki Masuda, Nishinomiya, JP;
Tsuyoshi Matsunami, Kyotanabe, JP;
OMRON Corporation, Kyoto, JP;
Abstract
An X-ray inspection apparatus includes a scanning X-ray source for emitting an X-ray, an X-ray detector drive unit having a plurality of X-ray detectors mounted thereon and being capable of independently driving the plurality of X-ray detectors, and an image acquisition control mechanism for controlling the X-ray detector drive unit and acquisition of image data from the X-ray detectors. The scanning X-ray source emits an X-ray by moving an X-ray focal point position of the X-ray source to each of originating point positions of X-ray emission, which are set for the X-ray detectors such that X-rays are transmitted through a plurality of prescribed inspection areas of an inspection object and enter the X-ray detectors. Image pickup by the X-ray detector and movement of another X-ray detector are concurrently performed in an alternate manner. The image acquisition control mechanism acquires image data, and an operation unit reconstructs an image.