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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10054432 B1

PDFFull Text
Date of Patent:
Aug. 21, 2018

Filed:

Aug. 24, 2017

X-ray inspection apparatus and control method

Applicant:

Omron Corporation, Kyoto-shi, Kyoto, JP;

Inventors:

Hironori Kasahara, Otsu, JP;

Shinji Sugita, Kyoto, JP;

Takako Onishi, Kyotanabe, JP;

Assignee:

OMRON Corporation, Kyoto-shi, JP;

Attorney:

Metrolexis Law Group, PLLC

Primary Examiner:

Hugh H Maupin

Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 11/25 (2006.01); H04N 13/282 (2018.01); G06T 7/55 (2017.01); G01N 23/083 (2018.01); G01N 23/18 (2018.01); G01N 23/223 (2006.01); G01S 15/89 (2006.01); G06T 7/00 (2017.01); H04N 13/02 (2006.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G01B 11/2527 (2013.01); G01N 23/046 (2013.01); G01N 23/083 (2013.01); G01N 23/18 (2013.01); G01N 23/223 (2013.01); G01S 15/8925 (2013.01); G06T 7/0002 (2013.01); G06T 7/55 (2017.01); H04N 13/0282 (2013.01); H04N 13/282 (2018.05); G01N 2223/611 (2013.01); G01N 2223/645 (2013.01); G01N 2223/646 (2013.01);
Abstract

An X-ray inspection apparatus includes a 3D processing unit that performs 3D imaging of a first area in an inspection area, a 2D processing unit that performs 2D imaging of a second area in the inspection area, an extraction unit that extracts 3D information for a first inspection target from a 3D image of the first area, and 2D information for a second inspection target from a 2D image of the second area, a 3D information estimation unit that estimates 3D information for the second inspection target using the extracted 3D information for the first inspection target, and an inspection unit that inspects the second inspection target using the 2D information for the second inspection target and the estimated 3D information for the second inspection target.

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