The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
May. 24, 2017
Omron Corporation, Kyoto-shi, Kyoto, JP;
OMRON Corporation, Kyoto-shi, JP;
Abstract
An X-ray inspection apparatus includes a stage that moves an inspection object, an X-ray source, and/or an X-ray camera by driving a motor, a position detection unit that periodically obtains a position detection value of the motor, and stores the value in association with time, an imaging timing obtaining unit that stores an imaging timing at which imaging is performed by the X-ray camera in association with time, an imaging position calculation unit that calculates relative positions of the inspection object, and the X-ray source and the X-ray camera corresponding to the imaging timing using the position detection value of the motor at the imaging timing, and a reconstruction unit that performs reconstruction using image data captured by the X-ray camera and the relative positions in the image data at the imaging timing.