Tokyo, Japan

Shinji Sugihara

USPTO Granted Patents = 28 

 

Average Co-Inventor Count = 2.4

ph-index = 7

Forward Citations = 183(Granted Patents)


Location History:

  • Kawasaki, JP (2008 - 2010)
  • Tokyo, JP (1994 - 2016)
  • Niigata-ken, JP (2010 - 2016)
  • Ota-ku, JP (2021 - 2023)

Company Filing History:


Years Active: 1994-2025

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28 patents (USPTO):Explore Patents

Title: **Shinji Sugihara: Pioneer in Pattern Inspection Technologies**

Introduction

Shinji Sugihara, an innovative inventor based in Tokyo, Japan, has made significant contributions to the field of pattern inspection technologies, evidenced by his impressive portfolio of 27 patents. His work focuses on advancing the methodologies and apparatuses used for evaluating patterns, which are essential in various applications, including semiconductor manufacturing and quality control.

Latest Patents

Among his latest innovations are two notable patents that demonstrate his technical expertise and inventive prowess. The first patent, titled "Pattern Inspection Apparatus and Pattern Outline Position Acquisition Method," involves a sophisticated circuit configuration designed to process images using multiple two-dimensional spatial filter functions arranged in various orientations. This technology allows for the extraction of outline pixel candidates based on their pixel values after filtering, resulting in decreased errors during pattern recognition.

The second patent, "Pattern Inspection Apparatus and Pattern Inspection Method," further enhances the precision of pattern analysis. It features a profile extraction circuit that isolates dimensional profiles based on differential intensity thresholds, along with a wavelet transform circuit that analyzes these profiles. This dual-circuit design helps to accurately pinpoint contour positions within figure patterns by examining peak positions of transformed profiles.

Career Highlights

Throughout his career, Shinji Sugihara has held key positions in renowned technology companies, such as Toshiba Corporation and Alps Electric Co., Ltd. His contributions in these roles have played a pivotal part in revolutionizing the methods used for pattern inspection in various industries.

Collaborations

Collaboration has been another cornerstone of Sugihara's career. He has worked alongside notable colleagues such as Riki Ogawa and Junji Oaki, contributing to shared projects that have produced groundbreaking technologies in inspection methods. These teamwork experiences have enriched his capacity for innovation and problem-solving in complex technical environments.

Conclusion

Shinji Sugihara stands out as a leading figure in the realm of pattern inspection, merging technological prowess with creative invention. His 27 patents reflect a commitment to enhancing inspection technologies, and his collaborations with esteemed colleagues further highlight the significant impact of his work. As industries continue to evolve, Sugihara's inventions are likely to remain at the forefront, driving excellence in pattern recognition and inspection methodologies.

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