The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Oct. 05, 2021
Nuflare Technology, Inc., Yokohama, JP;
Shinji Sugihara, Tokyo, JP;
NuFlare Technology, Inc., Yokohama, JP;
Abstract
A defect inspection apparatus includes an imaging mechanism for imaging a sample; an image acquisition circuit configured to generate an inspection image based on image data of the sample imaged by the imaging mechanism; a development circuit configured to generate a developed image from design data; a reference image generation circuit that includes a resizing process circuit configured to perform pattern classification from the developed image, and execute a resizing process for the developed image based on a resizing amount set for each classification, and that is configured to generate a reference image using the developed image after the resizing process; and a comparison circuit configured to compare the inspection image with the reference image.