Shinichi Oki

Title: The Innovations of Shinichi Oki

Introduction

Shinichi Oki is a prominent inventor based in Osaka, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 9 patents. His work has greatly influenced the methods used in testing semiconductor integrated circuits.

Latest Patents

Among his latest patents, Oki has developed a method of testing semiconductor integrated circuits. This method involves simultaneously testing multiple semiconductor integrated circuit elements for electric characteristics by applying a voltage to their respective testing electrodes. The process includes the use of PTC elements, which are provided in a one-to-one relationship with the semiconductor integrated circuit elements. Another notable patent is the design of a probe card, which is essential for testing the electric characteristics of multiple semiconductor chips formed on a semiconductor wafer. This probe card features a card body, multiple probe terminals, wiring, and a control element, all working together to facilitate efficient testing.

Career Highlights

Shinichi Oki has worked with notable companies such as Matsushita Electric Industrial Co., Ltd. and Matsushita Electrical Industrial Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to advancements in semiconductor technology.

Collaborations

Oki has collaborated with several talented individuals in his field, including Yoshiro Nakata and Koichi Nagao. These collaborations have fostered innovation and have led to the development of groundbreaking technologies.

Conclusion

Shinichi Oki's contributions to semiconductor technology through his patents and collaborations highlight his importance as an inventor. His innovative methods and designs continue to impact the industry significantly.