Shigeru Haneda

Title: Shigeru Haneda: Innovator in Charged Particle Beam Technology

Introduction

Shigeru Haneda is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of charged particle beam technology, holding a total of six patents. His innovative designs have advanced the capabilities of sample holders and charged particle beam apparatuses.

Latest Patents

Haneda's latest patents include a sample holder and charged particle beam apparatus. The sample holder is designed to efficiently apply pressure to the observation surface of a sample. It features a fixed electrode, a movable electrode, and a pressure applying member attached to the movable electrode. This design allows for precise control over the sample's positioning during observation. Another notable patent is a charged particle beam device that includes a sample holder capable of easily searching for an observation field of view. This sample holder incorporates a sample placement portion with a counterbore part and a rotational axis for horizontal rotation, enhancing the ease of use in experimental settings.

Career Highlights

Throughout his career, Haneda has worked with notable companies such as Hitachi High-Technologies Corporation and Hitachi High-Tech Corporation. His experience in these organizations has allowed him to refine his skills and contribute to cutting-edge technological advancements.

Collaborations

Haneda has collaborated with esteemed colleagues, including Naoki Sakamoto and Yasuyuki Momoi. Their combined expertise has fostered innovation and development in their respective fields.

Conclusion

Shigeru Haneda's contributions to charged particle beam technology and his innovative patents have established him as a key figure in the industry. His work continues to influence advancements in scientific research and technology.