Senthil Arasu Thirunavukarasu

This inventor holds 10 USPTO granted patents. Top assignee: Cadence Design Systems, Inc.. Active years: 2011-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Senthil Arasu Thirunavukarasu. Retrieved from https://idiyas.com/inventor/senthil-arasu-thirunavukarasu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 10

% Patents Active = 10.0

Average Co-Inventor Count = 3.1

ph-index = 4

Forward Citations = 41(Granted Patents)

Location History:

Bengaluru, IN (2011 - 2013)
Bangalor, IN (2012 - 2013)

Company Filing History:

10 out of 2,619

Cadence Design Systems, Inc.

patents

Years Active: 2011-2013

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10 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8595681 - Method and apparatus to use physical design information to detect IR drop prone test patterns (2013-11-26),

2. 8584074 - Testing to prescribe state capture by, and state retrieval from scan registers (2013-11-12),

3. 8438528 - Method and apparatus to use physical design information to detect IR drop prone test patterns (2013-05-07),

4. 8429593 - Method and apparatus to use physical design information to detect IR drop prone test patterns (2013-04-23),

5. 8392868 - Method and apparatus to use physical design information to detect IR drop prone test patterns (2013-03-05),

6. 8336019 - Method and apparatus to use physical design information to detect IR drop prone test patterns (2012-12-18),

7. 8286123 - Method and apparatus to use physical design information to detect IR drop prone test patterns (2012-10-09),

8. 7944285 - Method and apparatus to detect manufacturing faults in power switches (2011-05-17),

9. 7886263 - Testing to prescribe state capture by, and state retrieval from scan registers (2011-02-08),

10. 7877715 - Method and apparatus to use physical design information to detect IR drop prone test patterns (2011-01-25),

Title: Innovations of Senthil Arasu Thirunavukarasu

Introduction

Senthil Arasu Thirunavukarasu is a notable inventor based in Bangalore, India. He has made significant contributions to the field of integrated circuit design and testing. With a total of 10 patents to his name, his work has had a profound impact on the industry.

Latest Patents

One of his latest patents is titled "Method and apparatus to use physical design information to detect IR drop prone test patterns." This method evaluates whether one or more test patterns are power safe for use during manufacturing testing of an integrated circuit that includes a nonuniform power grid and a scan chain. The process involves assigning respective toggle count thresholds for different power grid regions and determining if the toggle counts by scan elements meet these thresholds during scan-in of a test pattern.

Another significant patent is "Testing to prescribe state capture by, and state retrieval from scan registers." In this innovation, state retention cells of a test circuit are interconnected to form scan chains. The unknown states, or X-states, are shifted through the scan chains in a different order than they were captured. This reordering helps align the X-states across multiple scan chains, achieving higher test compression in scan register circuit testing.

Career Highlights

Senthil currently works at Cadence Design Systems, Inc., where he continues to innovate in the field of electronic design automation. His expertise in integrated circuit testing and design has positioned him as a valuable asset to his company.

Collaborations

Some of his notable coworkers include Shaleen Bhabu and Vivek Chickermane. Their collaborative efforts contribute to the advancement of technology in their field.

Conclusion

Senthil Arasu Thirunavukarasu's contributions to integrated circuit design and testing through his patents demonstrate his innovative spirit and technical expertise. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]