The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7886263 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 08, 2011

Filed:

Dec. 10, 2007
Applicants:

Senthil Arasu Thirunavukarasu, Bangalore, IN;

Vivek Chickermane, Ithaca, NY (US);

Shaleen Bhabu, New Delhi, IN;

Inventors:

Senthil Arasu Thirunavukarasu, Bangalore, IN;

Vivek Chickermane, Ithaca, NY (US);

Shaleen Bhabu, New Delhi, IN;

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

State retention cells of a test circuit embedded in an electrical circuit are interconnected to form one or more scan chains. The scan chains are interconnected so that unknown states, or X-states, are shifted through the scan chains in an order other than the order in which the states were captured by the state retention cells of the scan chain. Such reordering of response states in individual scan chains may be used to align the X-states across multiple scan chains to achieve higher test compression scan register circuit testing.


Find Patent Forward Citations

Thirunavukarasu, Senthil. (2011). Testing to prescribe state capture by, and state retrieval from scan registers (U.S. Patent No. 7886263). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7886263

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