The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2012
Filed:
Jan. 24, 2011
Senthil Arasu Thirunavukarasu, Bangalor, IN;
Shaleen Bhabu, New Delhi, IN;
Vivek Chickermane, Ithaca, NY (US);
Senthil Arasu Thirunavukarasu, Bangalor, IN;
Shaleen Bhabu, New Delhi, IN;
Vivek Chickermane, Ithaca, NY (US);
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
A method is provided to evaluate whether one or more test patterns is power safe for use during manufacturing testing of an integrated circuit that includes a nonuniform power grid and that includes a scan chain, the method comprising: assigning respective toggle count thresholds for respective power grid regions of the non-uniform power grid; and determining whether respective numbers of toggles by scan elements of the scan chain within one or more respective power grid regions meet respective toggle count thresholds for the one or more respective regions during at least one scan-shift cycle in the course of scan-in of a test pattern to the scan chain.