Kanagawa, Japan

Seiya Amano

USPTO Granted Patents = 11 

 

Average Co-Inventor Count = 3.3

ph-index = 2

Forward Citations = 7(Granted Patents)


Location History:

  • Kawasaki, JP (2018)
  • Kanagawa, JP (2020 - 2022)

Company Filing History:


Years Active: 2018-2022

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11 patents (USPTO):

Title: Seiya Amano: Innovator in Measuring Technology

Introduction

Seiya Amano is a prominent inventor based in Kanagawa, Japan. He has made significant contributions to the field of measuring technology, holding a total of 11 patents. His work focuses on developing advanced measuring devices and systems that enhance precision and efficiency.

Latest Patents

Amano's latest patents include a measuring device and measuring system that utilize stereo cameras to capture images and measure disparity errors. The device incorporates circuitry to detect feature points and calculate measurement precision. Another notable patent is a distance-measuring apparatus that integrates multiple imaging devices and laser technology to provide accurate distance information. This innovative approach allows for pixel-by-pixel analysis and enhances the capabilities of mobile objects equipped with the measuring apparatus.

Career Highlights

Seiya Amano is currently associated with Ricoh Company, Ltd., where he continues to push the boundaries of measuring technology. His work has been instrumental in developing solutions that cater to various industrial applications, showcasing his expertise and commitment to innovation.

Collaborations

Amano has collaborated with notable colleagues, including Soichiro Yokota and Hiroyoshi Sekiguchi. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Seiya Amano's contributions to measuring technology exemplify his dedication to innovation and precision. His patents reflect a deep understanding of the complexities involved in measurement systems, making him a key figure in the field.

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