The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 09, 2022

Filed:

Apr. 28, 2020
Applicant:

Ricoh Company, Ltd., Tokyo, JP;

Inventors:

Hiroki Mima, Kanagawa, JP;

Seiya Amano, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01C 3/14 (2006.01);
U.S. Cl.
CPC ...
G06T 7/97 (2017.01); G01C 3/14 (2013.01); G06T 2207/10012 (2013.01);
Abstract

A measuring device and a measuring system. The measuring device includes circuitry to obtain at least one pair of stereo captured images captured by a stereo camera, detect two or more feature points from each one of the at least one pair of stereo captured images, and measure a disparity error using a distance between a pair of feature points of the two or more feature points on each one of the at least one pair of stereo captured images, where an equation is satisfied. In the equation, Sdenotes the distance, Δ denotes a detection error between the pair of imaging devices. Moreover, Edenotes precision of measurement of a disparity error in disparity between a pair of images of the at least one pair of stereo captured images, and d denotes the disparity. The stereo camera including a pair of imaging devices.


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