Haibara-gun, Japan

Seiichi Hitomi

This inventor holds 19 USPTO granted patents and 14 published patent applications and 7 EPO patents. Top assignee: Fujifilm Corporation. Active years: 2016-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Seiichi Hitomi. Retrieved from https://idiyas.com/inventor/seiichi-hitomi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 19 

% Patents Active = 63.2

 

Average Co-Inventor Count = 3.5

ph-index = 2

Forward Citations = 14(Granted Patents)


Location History:

  • Ahigarakami-gun, JP (2018)
  • Shizuoka, JP (2016 - 2019)
  • Haibara-gun, JP (2016 - 2021)
  • Kanagawa, JP (2020 - 2024)
  • Ashigara-kami-gun, JP (2022 - 2024)

Company Filing History:


Years Active: 2016-2026

Loading Chart...
Loading Chart...
19 patents (USPTO):Explore Patents

Title: Seiichi Hitomi: Pioneering Inventor from Haibara-gun, Japan

Introduction: Seiichi Hitomi is a renowned inventor hailing from Haibara-gun, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Seiichi Hitomi holds several patents in various technological domains, showcasing his continuous commitment to pushing the boundaries of innovation.

Career Highlights: Throughout his illustrious career, Seiichi Hitomi has been instrumental in developing cutting-edge technologies that have revolutionized industries and improved the lives of many.

Collaborations: Seiichi Hitomi has collaborated with leading tech companies, research institutions, and universities worldwide, fostering a culture of innovation and knowledge exchange.

Conclusion: Seiichi Hitomi's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…