Santa Barbara, CA, United States of America

Sean Michael Hand

USPTO Granted Patents = 6 

Average Co-Inventor Count = 3.6

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018-2023

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6 patents (USPTO):Explore Patents

Title: Innovations of Sean Michael Hand

Introduction

Sean Michael Hand is a prominent inventor based in Santa Barbara, CA. He has made significant contributions to the field of atomic force microscopy (AFM) with a total of 6 patents to his name. His work focuses on enhancing the capabilities of AFM technology, which is crucial for various applications in nanotechnology and materials science.

Latest Patents

Among his latest patents, one notable invention is the "AFM imaging with metrology-preserving real time denoising." This method operates an atomic force microscope using a denoising algorithm in real-time during data acquisition. The preferred techniques include Total Variation and Non-Local Means denoising, which result in real-time images with minimized sensor noise, eliminating the need for post-image acquisition processing. Another significant patent is "AFM imaging with creep correction." This invention involves an atomic force microscope that utilizes a separate Z height sensor to measure probe sample distance simultaneously with AFM system control. By mapping AFM data to low-resolution Z height data, a high-resolution final image corrected for creep is generated in real-time.

Career Highlights

Sean Michael Hand is currently employed at Bruker Nano GmbH, where he continues to innovate and develop advanced AFM technologies. His work has been instrumental in pushing the boundaries of what is possible in the field of microscopy.

Collaborations

Throughout his career, Sean has collaborated with notable colleagues, including Jason Osborne and Vladimir Fonoberov. These partnerships have fostered a creative environment that encourages the exchange of ideas and advancements in technology.

Conclusion

Sean Michael Hand's contributions to atomic force microscopy through his innovative patents and collaborations highlight his role as a leading inventor in the field. His work continues to influence advancements in nanotechnology and materials science.

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