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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11714104 B1

PDFFull Text
Date of Patent:
Aug. 01, 2023

Filed:

May. 25, 2021

Afm imaging with creep correction

Applicant:

Bruker Nano, Inc., Santa Barbara, CA (US);

Inventors:

Jason Osborne, Lompoc, CA (US);

Sean Hand, Santa Barbara, CA (US);

Vladimir Fonoberov, Santa Barbara, CA (US);

James Young, Santa Barbara, CA (US);

Assignee:

Bruker Nano, Inc., Santa Barbara, CA (US);

Attorney:

Boyle Fredrickson S.C.

Primary Examiner:

Eliza W Osenbaugh-Stewart

Int. Cl.
CPC ...
G01Q 30/06 (2010.01); G01Q 60/38 (2010.01); G01Q 10/04 (2010.01); B82Y 35/00 (2011.01); G01Q 20/04 (2010.01); G01Q 60/34 (2010.01);
U.S. Cl.
CPC ...
G01Q 30/06 (2013.01); B82Y 35/00 (2013.01); G01Q 10/045 (2013.01); G01Q 20/04 (2013.01); G01Q 60/34 (2013.01); G01Q 60/38 (2013.01);
Abstract

An atomic force microscope (AFM) and method of operating the same includes a separate Z height sensor to measure, simultaneously with AFM system control, probe sample distance, pixel-by-pixel during AFM data acquisition. By mapping the AFM data to low resolution data of the Z height data, a high resolution final data image corrected for creep is generated in real time.

Find Patent Forward Citations

Osborne, Jason. (2023). Afm imaging with creep correction (U.S. Patent No. 11714104). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11714104

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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