Jason Osborne

Title: Inventor Profile: Jason Osborne

Introduction

Jason Osborne is an accomplished inventor based in Lompoc, California. With a total of eight patents to his name, he has made significant contributions to the field of atomic force microscopy (AFM). His innovative methods enhance the performance and accuracy of AFM technology, showcasing his expertise and creativity in instrumentation.

Latest Patents

Two of Jason Osborne's latest patents demonstrate his dedication to advancing AFM technology. The first patent, titled "AFM Imaging with Metrology-Preserving Real Time Denoising," describes a method for operating an atomic force microscope while employing a denoising algorithm in real-time during the data acquisition process. This technique utilizes Total Variation and Non-Local Means denoising to minimize sensor noise, yielding real-time images that require no post-acquisition processing.

The second patent, "AFM Imaging with Creep Correction," presents an innovative approach to AFM operation by incorporating a separate Z height sensor. This sensor measures the probe-sample distance simultaneously with AFM control, allowing for pixel-by-pixel distance measurement during data acquisition. By mapping the AFM data to low-resolution Z height data, high-resolution final images are generated in real-time, effectively correcting for creep.

Career Highlights

Throughout his career, Jason has worked with reputable companies in the field of microscopy and instrumentation. Notably, he has been associated with Bruker Nano GmbH and Veeco Instruments Inc. His work in these organizations has contributed to various advancements in AFM technology and measurement techniques.

Collaborations

Jason Osborne has collaborated with talented professionals in his field, including coworkers Vladimir Fonoberov and Sean Michael Hand. Their joint efforts have facilitated the pursuit of innovative solutions and improvements in AFM technology.

Conclusion

In conclusion, Jason Osborne stands out as a prominent inventor in the realm of atomic force microscopy. His significant contributions, particularly through his recent patents, underscore his role in pushing the boundaries of AFM technology. With his continued dedication to innovation, Jason Osborne is sure to impact the field positively for years to come.