The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 06, 2023
Filed:
Apr. 06, 2021
Applicant:
Bruker Nano, Inc., Santa Barbara, CA (US);
Inventors:
Jason Osborne, Lompoc, CA (US);
Vladimir Fonoberov, Santa Barbara, CA (US);
Sean Michael Hand, Santa Barbara, CA (US);
Assignee:
Bruker Nano, Inc., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/30 (2010.01); G01Q 60/38 (2010.01); G01R 1/067 (2006.01); G01Q 10/06 (2010.01); G01Q 20/02 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/30 (2013.01); G01Q 60/38 (2013.01); G01R 1/067 (2013.01); G01Q 10/06 (2013.01); G01Q 20/02 (2013.01);
Abstract
An apparatus and method of operating an atomic force profiler (AFP), such as an AFM, using a feedforward control signal in subsequent scan lines of a large area sample to achieve large throughput advantages in, for example, automated applications.