The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2023
Filed:
Apr. 09, 2021
Applicant:
Bruker Nano, Inc., Santa Barbara, CA (US);
Inventors:
Vladimir Fonoberov, Lompoc, CA (US);
James Young, Santa Barbara, CA (US);
Jason Osborne, Lompoc, CA (US);
Sean Hand, Santa Barbara, CA (US);
Assignee:
Bruker Nano, Inc., Santa Barbara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 30/06 (2010.01); G01Q 60/24 (2010.01); G06T 5/50 (2006.01); G06T 5/20 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G01Q 30/06 (2013.01); G01Q 60/24 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01); G06T 2207/10056 (2013.01);
Abstract
A method of operating an atomic force microscope (AFM), using a denoising algorithm, real-time, during AFM data acquisition. Total Variation and Non-Local Means denoising are preferred. Real time images with minimized sensor noise needing no post-image acquisition processing to account for noise as described herein results.