San Diego, CA, United States of America

Se Rin Lee


 

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2022

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2 patents (USPTO):Explore Patents

Title: Se Rin Lee: Innovator in Printed Circuit Board Inspection Technology

Introduction

Se Rin Lee is a notable inventor based in San Diego, CA, who has made significant contributions to the field of printed circuit board inspection technology. With a total of 2 patents to his name, Lee's work focuses on enhancing the accuracy and efficiency of component inspection processes.

Latest Patents

Lee's latest patents include a method for inspecting the mounting state of components and a printed circuit board inspection apparatus. The first patent describes a system that generates depth information on components mounted on printed circuit boards by utilizing a pattern of light reflected from the components. This information is processed through a machine-learning-based model to reduce noise and improve inspection accuracy. The second patent outlines a similar approach, where depth information and two-dimensional image data are generated using various wavelengths of light. This innovative method also employs machine learning to enhance the quality of the inspection data.

Career Highlights

Se Rin Lee is currently employed at Koh Young Technology Inc., a company renowned for its advanced inspection solutions. His work at Koh Young has positioned him as a key player in the development of cutting-edge technologies that improve manufacturing processes.

Collaborations

Lee collaborates with talented coworkers, including Jin Man Kang and Joong Ki Jeong, who contribute to the innovative environment at Koh Young Technology Inc. Their teamwork fosters creativity and drives advancements in inspection technology.

Conclusion

Se Rin Lee's contributions to printed circuit board inspection technology exemplify the impact of innovation in the manufacturing sector. His patents reflect a commitment to improving inspection methods through advanced technology and collaboration.

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