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For the Inventor, By the Inventor

Boise, ID, United States of America

Scott N Gatzemeier

This inventor holds 17 USPTO granted patents. Top assignee: Micron Technology Incorporated. Active years: 2005-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Scott N Gatzemeier. Retrieved from https://idiyas.com/inventor/scott-n-gatzemeier

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 17

% Patents Active = 76.5

Average Co-Inventor Count = 3.3

ph-index = 6

Forward Citations = 113(Granted Patents)


Location History:

  • Boise, ID (US) (2005 - 2012)
  • Alpine, UT (US) (2009 - 2014)

Company Filing History:

goldMedal17 out of 39,222 
 
Micron Technology Incorporated
 patents

Years Active: 2005-2014

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17 patents (USPTO):Explore Patents
1. 8687435 - System and method for reducing pin-count of memory devices, and memory device testers for same (2014-04-01),
2. 8400844 - System and method for reducing pin-count of memory devices, and memory device testers for same (2013-03-19),
3. 8094508 - Memory block testing (2012-01-10),
4. 8072820 - System and method for reducing pin-count of memory devices, and memory device testers for same (2011-12-06),
5. 8024629 - Input/output compression and pin reduction in an integrated circuit (2011-09-20),
6. 7707467 - Input/output compression and pin reduction in an integrated circuit (2010-04-27),
7. 7620768 - Multiple erase block tagging in a flash memory device (2009-11-17),
8. 7567472 - Memory block testing (2009-07-28),
9. 7554858 - System and method for reducing pin-count of memory devices, and memory device testers for same (2009-06-30),
10. 7512507 - Die based trimming (2009-03-31),
11. 7411848 - Independent polling for multi-page programming (2008-08-12),
12. 7292487 - Independent polling for multi-page programming (2007-11-06),
13. 7168018 - Apparatus and method for reducing test resources in testing DRAMs (2007-01-23),
14. 7116584 - Multiple erase block tagging in a flash memory device (2006-10-03),
15. 6986084 - Apparatus and method for reducing test resources in testing DRAMS (2006-01-10),

Certainly, let's get started on the article about inventor Scott N Gatzemeier:

Title:

Innovator Spotlight: Scott N Gatzemeier - Revolutionizing Memory Devices

Introduction:

Scott N Gatzemeier, a distinguished inventor based in Boise, ID, has made significant contributions to the field of memory devices with an impressive portfolio of 17 patents.

Latest Patents:

Among his recent patents is a groundbreaking "System and Method for Reducing Pin-Count of Memory Devices," where innovative methods, memory devices, and systems are revealed. This invention showcases a non-volatile memory device that optimizes command signals through input/output terminals, addressing signals, and data transmission.

Career Highlights:

Scott N Gatzemeier is a key figure at Micron Technology Incorporated, a prominent player in the technology industry. His expertise and innovative spirit have been instrumental in driving advancements in memory devices and related technologies.

Collaborations:

Throughout his career, Scott has collaborated closely with esteemed colleagues such as Adam D Johnson and Wallace E Fister. Together, they have pushed the boundaries of memory device technology and brought forth groundbreaking solutions in the industry.

Conclusion:

Inventor Scott N Gatzemeier's relentless pursuit of innovation and his keen understanding of memory devices have earned him a well-deserved reputation as a trailblazer in the field. His patents and contributions continue to shape the future of memory devices, leaving a lasting impact on the industry.

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Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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