The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2007

Filed:

May. 25, 2004
Applicants:

Chris Cooper, Biose, ID (US);

Siang Tian Giam, Singapore, SG;

Jerry D. Mcbride, Boise, ID (US);

Scott N. Gatzemeier, Boise, ID (US);

Scott L. Ayres, Meridian, ID (US);

David R. Brown, Allen, TX (US);

Inventors:

Chris Cooper, Biose, ID (US);

Siang Tian Giam, Singapore, SG;

Jerry D. McBride, Boise, ID (US);

Scott N. Gatzemeier, Boise, ID (US);

Scott L. Ayres, Meridian, ID (US);

David R. Brown, Allen, TX (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and a method are disclosed for reducing the pin driver count required for testing computer memory devices, specifically Rambus DRAM, while a die is on a semiconductor wafer. By reducing the pin count, more DRAMs can be tested at the same time, thereby reducing test cost and time. One preferred embodiment utilizes a trailing edge of a precharge clock to select a new active bank address, so that the address line required to select a new active address does not have to be accessed at the same time as the row lines.


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