Chris Cooper

Title: Chris Cooper: Innovator in Memory Testing Technology

Introduction

Chris Cooper is a notable inventor based in Boise, ID (US), recognized for his contributions to the field of computer memory technology. With a total of 5 patents to his name, he has made significant advancements that enhance the efficiency and effectiveness of memory testing processes.

Latest Patents

One of his latest patents is titled "Apparatus and method for reducing test resources in testing DRAMs." This invention discloses an apparatus and method aimed at reducing the pin driver count required for testing computer memory devices, specifically Rambus DRAM, while a die is on a semiconductor wafer. By minimizing the pin count, more DRAMs can be tested simultaneously, which leads to reduced testing costs and time. Another significant patent is the "Delay locked loop circuit with time delay quantifier and control." This invention features a delay locked loop circuit that includes a quantifier for measuring the delay quantity based on the time difference between an external signal and an internal signal. The delay controller then adjusts the correction delay quantity applied to the signal path of the external signal to ensure synchronization between the external and internal signals.

Career Highlights

Chris Cooper is currently employed at Micron Technology Incorporated, a leading company in the semiconductor industry. His work focuses on developing innovative solutions that improve memory testing methodologies and enhance overall performance.

Collaborations

Throughout his career, Chris has collaborated with talented individuals such as Siang Tian Giam and Jerry D McBride. These collaborations have contributed to the successful development of his patented technologies.

Conclusion

Chris Cooper's innovative work in memory testing technology has made a significant impact on the industry. His patents reflect a commitment to improving efficiency and reducing costs in the testing of computer memory devices.