Fremont, CA, United States of America

Satya Kurada

This inventor holds 4 USPTO granted patents and 2 published patent applications. Top assignee: Kla Tencor Corporation. Active years: 2016-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Satya Kurada. Retrieved from https://idiyas.com/inventor/satya-kurada

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4 

% Patents Active = 100.0

Average Co-Inventor Count = 5.3

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2016-2020

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4 patents (USPTO):Explore Patents

Title: Innovations by Satya Kurada

Introduction

Satya Kurada is an accomplished inventor based in Fremont, CA. He has made significant contributions to the field of defect detection in semiconductor manufacturing. With a total of 4 patents to his name, Kurada's work has advanced the methodologies used in identifying and analyzing defects in various specimens.

Latest Patents

One of his latest patents focuses on creating defect samples for array regions. This patent outlines methods and systems for generating a sample of defects based on outputs from a detection subsystem. The process involves detecting defects in an array region that contains multiple cell types and stacking information for these defects accordingly. Another notable patent is related to repeater detection, which provides systems and methods for identifying defects on a wafer. This method includes generating test images from frame images and determining difference images to detect defects effectively.

Career Highlights

Satya Kurada is currently employed at Kla Tencor Corporation, a leading company in the semiconductor industry. His innovative approaches have contributed to the company's reputation for excellence in defect detection technologies.

Collaborations

Throughout his career, Kurada has collaborated with talented individuals such as Raghav Babulnath and Kwok Ng. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Satya Kurada's contributions to the field of semiconductor defect detection are noteworthy. His innovative patents and collaborations reflect his commitment to advancing technology in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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