Hillsboro, OR, United States of America

Sang Hoon Lee

USPTO Granted Patents = 9 

 

Average Co-Inventor Count = 3.9

ph-index = 4

Forward Citations = 30(Granted Patents)


Location History:

  • Los Angeles, CA (US) (2010)
  • Hillsboro, OR (US) (2014 - 2017)
  • Forest Grive, OR (US) (2018)
  • Forest Grove, OR (US) (2016 - 2022)

Company Filing History:


Years Active: 2010-2022

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9 patents (USPTO):Explore Patents

Title: Innovations by Sang Hoon Lee

Introduction

Sang Hoon Lee is a prominent inventor based in Hillsboro, OR (US). He has made significant contributions to the field of charged particle beam technology, holding a total of 9 patents. His work focuses on advanced methods for analyzing samples and improving fiducial designs in nanoscale structures.

Latest Patents

One of his latest patents is titled "Fiducial design for tilted or glancing mill operations with a charged particle beam." This patent describes a method for analyzing a sample using a charged particle beam. The process involves directing the beam toward the sample surface and milling it to expose a second surface. The end of the second surface, which is distal to the ion source, is milled to a greater depth than the end of the first surface, which is proximal to the ion source. The charged particle beam is then directed toward the second surface to form images, allowing for the detection of interactions with the electron beam. This method enables the assembly of cross-sectional images into a three-dimensional model of features of interest.

Career Highlights

Sang Hoon Lee works at FEI Company, where he has been instrumental in developing innovative technologies. His expertise in charged particle beam applications has positioned him as a key figure in the field.

Collaborations

He collaborates with notable coworkers, including Jeffrey Blackwood and Stacey Stone, contributing to a dynamic team focused on advancing technology in their field.

Conclusion

Sang Hoon Lee's contributions to charged particle beam technology and his innovative patents highlight his significant role as an inventor. His work continues to influence advancements in nanoscale analysis and imaging techniques.

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