This inventor holds 3 USPTO granted patents and 2 published patent applications. Top assignee: Jtekt Corporation. Active years: 2019-2020.
Company Filing History:
Years Active: 2019-2020
Title: Innovations by Sakon Murayama
Introduction
Sakon Murayama is a notable inventor based in Kariya, Japan. He has made significant contributions to the field of analysis systems, holding a total of 3 patents. His work focuses on enhancing data analysis and evaluation processes in production facilities.
Latest Patents
One of his latest patents is an analysis system that includes detectors in an apparatus. This system features first analysis devices that generate processed data by performing predetermined processing on detection information from each detector. It evaluates an object based on this detection information and an evaluation pattern. Additionally, a second analysis device updates the evaluation pattern based on the processed data generated by the first analysis devices.
Another significant patent is the abnormality analysis system and analysis apparatus. This innovation connects multiple production facilities through a fog network. The analysis apparatus performs data analysis based on detection information acquired through the fog network. It stores determination information related to abnormalities in each production facility or production object as a result of the data analysis. Each facility can then determine abnormalities based on the stored determination information.
Career Highlights
Sakon Murayama is currently employed at Jtekt Corporation, where he continues to develop innovative solutions in the field of analysis systems. His work has been instrumental in improving operational efficiency and reliability in production environments.
Collaborations
He collaborates with talented coworkers, including Toshiyuki Tsuzuki and Yuki Ishigure, who contribute to the innovative projects at Jtekt Corporation.
Conclusion
Sakon Murayama's contributions to the field of analysis systems demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of data analysis and its applications in production facilities.