The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Aug. 04, 2017
Applicant:
Jtekt Corporation, Osaka-shi, JP;
Inventors:
Assignee:
JTEKT CORPORATION, Osaka-shi, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); G05B 19/406 (2006.01); G01H 13/00 (2006.01); G05B 19/414 (2006.01);
U.S. Cl.
CPC ...
G01M 99/008 (2013.01); G01H 13/00 (2013.01); G05B 19/406 (2013.01); G05B 19/4145 (2013.01); G05B 2219/34273 (2013.01); G05B 2219/37434 (2013.01); G05B 2219/37435 (2013.01);
Abstract
An analysis system includes detectors provided in an apparatus, first analysis devices each configured to generate processed data by performing predetermined processing on detection information from each of the detectors, and to evaluate an object to be evaluated based on the detection information from each of the detectors and on an evaluation pattern, and a second analysis device configured to update the evaluation pattern based on the processed data generated by each of the first analysis devices.