The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Nov. 11, 2016
Applicant:

Jtekt Corporation, Osaka-shi, JP;

Inventors:

Toshiyuki Tsuzuki, Anjo, JP;

Katsushi Kitamura, Nagoya, JP;

Koji Kito, Toyota, JP;

Sakon Murayama, Kariya, JP;

Yuki Ishigure, Gifu, JP;

Assignee:

JTEKT CORPORATION, Osaka-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/406 (2006.01); G05B 23/02 (2006.01); G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/406 (2013.01); G05B 19/41875 (2013.01); G05B 23/0235 (2013.01); G05B 23/0262 (2013.01); G05B 2219/24033 (2013.01); G05B 2219/32222 (2013.01);
Abstract

A plurality of production facilities and an analysis apparatus are connected through a fog network. The analysis apparatus performs a data analysis based on detection information of detectors acquired through the fog network and stores determination information relating to an abnormality of each of the plurality of production facilities or an abnormality of a production object as a result of the data analysis. Each of the plurality of production facilities determines an abnormality of the each of the plurality of production facilities or an abnormality of the production object based on the determination information stored in the analysis apparatus.


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