Nagoya, Japan

Katsushi Kitamura

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Jtekt Corporation. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Katsushi Kitamura. Retrieved from https://idiyas.com/inventor/katsushi-kitamura-880k447l

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Katsushi Kitamura: Innovator in Abnormality Analysis Systems

Introduction

Katsushi Kitamura is a notable inventor based in Nagoya, Japan. He has made significant contributions to the field of data analysis through his innovative patent. His work focuses on enhancing the efficiency and reliability of production facilities.

Latest Patents

Katsushi Kitamura holds a patent for an "Abnormality analysis system and analysis apparatus." This invention connects multiple production facilities and an analysis apparatus through a fog network. The analysis apparatus performs data analysis based on detection information from various detectors acquired through the fog network. It stores determination information related to abnormalities in each production facility or production object as a result of this analysis. Each production facility can then determine abnormalities based on the stored information.

Career Highlights

Katsushi Kitamura is currently employed at Jtekt Corporation, where he continues to innovate and develop advanced technologies. His work has been instrumental in improving production processes and ensuring quality control in manufacturing.

Collaborations

Katsushi collaborates with talented coworkers, including Toshiyuki Tsuzuki and Yuki Ishigure. Their combined expertise contributes to the success of their projects and the advancement of technology at Jtekt Corporation.

Conclusion

Katsushi Kitamura is a prominent inventor whose work in abnormality analysis systems has the potential to revolutionize production facilities. His innovative approach and dedication to technology continue to make a significant impact in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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