Jtekt Corporation

Sakon Murayama

Yuki Ishigure

Toshiyuki Tsuzuki

Koji Kito

Tomoyuki Nakagawa

Katsushi Kitamura

An analysis system includes detectors provided in an apparatus, first analysis devices each configured to generate processed data by performing predetermined processing on detection information from each of the detectors, and to evaluate an object to be evaluated based on the detection information from each of the detectors and on an evaluation pattern, and a second analysis device configured to update the evaluation pattern based on the processed data generated by each of the first analysis devices.

Analysis system

A plurality of production facilities and an analysis apparatus are connected through a fog network. The analysis apparatus performs a data analysis based on detection information of detectors acquired through the fog network and stores determination information relating to an abnormality of each of the plurality of production facilities or an abnormality of a production object as a result of the data analysis. Each of the plurality of production facilities determines an abnormality of the each of the plurality of production facilities or an abnormality of the production object based on the determination information stored in the analysis apparatus.

Abnormality analysis system and analysis apparatus

An optical detection device includes: an optical sensor configured to detect light from a light source of an indication lamp; an optical-detection-side communication unit configured to wirelessly transmit at least an optical detection signal of the optical sensor; and a photoelectric conversion unit configured to convert light from the light source into power and to store the power. The optical sensor and the optical-detection-side communication unit operate using the power stored in the photoelectric conversion unit.

Growing community of inventors

Kariya, Japan

Sakon Murayama