Osaka, Japan

Ryosuke Ishii


 

Average Co-Inventor Count = 5.2

ph-index = 2

Forward Citations = 6(Granted Patents)


Location History:

  • Amagasaki, JP (2012)
  • Osaka, JP (2012 - 2013)

Company Filing History:


Years Active: 2012-2013

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5 patents (USPTO):Explore Patents

Title: The Innovations of Ryosuke Ishii

Introduction

Ryosuke Ishii is a prominent inventor based in Osaka, Japan, known for his significant contributions to the field of semiconductor technology. With a total of five patents to his name, Ishii has focused on enhancing the performance and reliability of bipolar semiconductor devices. His work has implications for various applications in the electronics industry.

Latest Patents

Ishii's latest patents include a method for recovering an on-state forward voltage and shrinking stacking faults in bipolar semiconductor devices. This innovation addresses the challenges faced in bipolar semiconductor devices, particularly in silicon carbide epitaxial films. The method involves heating the device at temperatures higher than 350°C to recover the on-state forward voltage that has increased due to stacking faults. Another notable patent is the process for producing silicon carbide semiconductor devices, which aims to reduce defects that lead to stacking faults during current passage. This method includes a thermal treatment at temperatures of 300°C or higher in the final production step, ideally after electrode formation.

Career Highlights

Throughout his career, Ryosuke Ishii has worked with esteemed organizations such as the Central Research Institute of Electric Power Industry and Kansai Electric Power Co., Inc. His experience in these institutions has allowed him to develop and refine his innovative approaches to semiconductor technology.

Collaborations

Ishii has collaborated with notable colleagues, including Koji Nakayama and

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