Ryoichi Utsumi

Title: Ryoichi Utsumi: Innovator in Test Apparatus Technology

Introduction

Ryoichi Utsumi is a notable inventor based in Sendai, Japan. He has made significant contributions to the field of test apparatus technology, particularly in the testing of wafers that include magnetoresistive memory and magnetic sensors. With a total of 3 patents to his name, Utsumi's work has advanced the capabilities of diagnostic processes in semiconductor testing.

Latest Patents

Utsumi's latest patents include innovative test apparatuses designed to enhance the testing process of wafers. One of his patents describes a test apparatus that tests a wafer under test, which includes devices such as magnetoresistive memory or magnetic sensors. In this process, the wafer is mounted on a stage, and a magnetic field application apparatus applies a magnetic field to the wafer. A test probe card is utilized during the testing, and multiple magnetization detection units are formed on a diagnostic wafer. This diagnostic wafer is mounted on the stage in place of the wafer under test, allowing for precise measurement of the magnetic field generated by the application apparatus.

Another patent outlines a similar test apparatus that also tests a wafer under test. In this design, the test probe card is configured to make probe contact with the wafer, and a wafer connection HiFix is arranged between the test probe card and a test head. The magnetic field application apparatus is integrated into the wafer connection HiFix, ensuring accurate application of the magnetic field during the testing process.

Career Highlights

Throughout his career, Ryoichi Utsumi has worked with prominent companies in the technology sector. He has been associated with Toei Scientific Industrial Co., Ltd. and Adv Antest Corporation, where he has contributed to the development of advanced testing technologies. His expertise in the field has positioned him as a key figure in the innovation of test apparatuses.

Collaborations

Utsumi has collaborated with notable professionals in his field, including Shigeyuki Sato and Naoyoshi Watanabe. These collaborations have further enriched his work and contributed to the advancements in test apparatus technology.

Conclusion

Ryoichi Utsumi's contributions to the field of test apparatus technology have made a significant impact on the semiconductor industry. His innovative patents and collaborations highlight his dedication to advancing testing processes, ensuring that the technology continues