Roman S Basistyy is a notable inventor based in Sunny Isles Beach, FL (US). He has made significant contributions to the field of semiconductor defect detection, holding a total of 2 patents. His work focuses on enhancing the accuracy of defect detection in semiconductor devices, which is crucial for the manufacturing process.

Latest Patents

Roman's latest patents include innovative techniques for improving defect detection. One of his patents, titled "Periodic-pattern background removal," describes mechanisms and methods to subtract signals caused by periodic patterns on substrates. This advancement enables a higher level of defect detection by reducing or eliminating signals detected by metrology and substrate-inspection systems. The use of Fourier analysis allows for the application of gray-scale value thresholds and area thresholds, resulting in a final image with significantly fewer false defects.

Another patent, "Low contrast non-referential defect detection," focuses on inspecting semiconductor devices, such as CMOS image sensors, during manufacturing. This technique addresses both common defects and low-contrast defects, utilizing a supervised machine learning network to enhance detection capabilities.

Career Highlights

Roman S Basistyy is currently employed at Onto Innovation Inc., where he continues to develop and refine his innovative techniques in semiconductor technology. His work has been instrumental in advancing the field and improving manufacturing processes.

Collaborations

Roman collaborates with Jian Ding, a fellow innovator in the industry. Their combined expertise contributes to the development of cutting-edge solutions in semiconductor defect detection.

Conclusion

Roman S Basistyy is a prominent figure in the realm of semiconductor technology, with a focus on defect detection. His patents reflect his commitment to innovation and excellence in the field. His contributions are paving the way for advancements in semiconductor manufacturing processes.