Richard T Ida

Title: Richard T Ida: Innovator in ESD Protection Technologies

Introduction

Richard T Ida is a prominent inventor based in Chandler, AZ (US), known for his significant contributions to electrostatic discharge (ESD) protection technologies. With a total of 8 patents to his name, he has made notable advancements in the field, particularly in the design and implementation of devices that safeguard electronic components from ESD events.

Latest Patents

Among his latest patents is the "Process Insensitive ESD Protection Device," which outlines methods and apparatus for ESD protection of LDMOS devices. This innovative apparatus consists of two LDMOS devices, with source, drain, and gate contacts parallel coupled. One device serves as the protected device, while the other acts as the protecting device. Each device features a source region, drain region, gate, and body well regions, with specific configurations designed to enhance ESD protection. Another significant patent is the "Low Voltage NMOS-Based Electrostatic Discharge Clamp," which describes systems and methods for a low-voltage ESD clamp. This design utilizes a resistor pwell-tied transistor to reduce DC leakage current and minimize latch-ups while maintaining effective ESD performance.

Career Highlights

Richard has had a distinguished career, working with leading companies in the semiconductor industry. He has held positions at Freescale Semiconductor, Inc. and Motorola Corporation, where he contributed to the development of advanced technologies in ESD protection.

Collaborations

Throughout his career, Richard has collaborated with notable professionals in the field, including Hongzhong Xu and Michael Baird. These collaborations have further enriched his work and contributed to the advancement of ESD protection technologies.

Conclusion

Richard T Ida's innovative work in ESD protection has significantly impacted the semiconductor industry. His patents reflect a deep understanding of electronic device protection, ensuring the reliability and longevity of modern electronic components.