Hamm, Germany

Rene Krenz-Baath

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignees: Mentor Graphics Corporation, Hochschule Hamm-Lippstadt. Active years: 2013-2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rene Krenz-Baath. Retrieved from https://idiyas.com/inventor/rene-krenz-baath

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 1.9

ph-index = 2

Forward Citations = 5(Granted Patents)


Location History:

  • Hamburg, DE (2013)
  • Hamm, DE (2014 - 2022)

Company Filing History:


Years Active: 2013-2022

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3 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Rene Krenz-Baath

Introduction

Rene Krenz-Baath is a notable inventor based in Hamm, Germany. She has made significant contributions to the field of microchip technology, holding a total of 3 patents. Her work focuses on enhancing the efficiency and effectiveness of testing structures within microchips.

Latest Patents

One of her latest patents is titled "Microchip having a plurality of reconfigurable test structures." This invention relates to a microchip that features multiple reconfigurable test structures. The microchip includes a test input (TDI) and a test output (TDO), allowing each test structure to be connected to these inputs and outputs. Each test structure is equipped with an intermediate memory, enabling them to be tested separately and concurrently with individual control.

Another significant patent is "Multi-targeting boolean satisfiability-based test pattern generation." This patent discloses methods and systems for generating test patterns that target multiple faults using Boolean Satisfiability (SAT)-based techniques. A SAT instance is constructed based on circuit design information and a set of targeted faults. A SAT solving engine is then applied to search for a test pattern that can detect these faults, with the potential to modify the SAT instance for maximum fault detection.

Career Highlights

Rene has worked with prominent companies such as Mentor Graphics Corporation and Hochschule Hamm-Lippstadt. Her experience in these organizations has contributed to her expertise in microchip technology and testing methodologies.

Collaborations

Throughout her career, Rene has collaborated with notable colleagues, including Friedrich Hapke and Juergen Schloeffel. These collaborations have further enriched her work and innovations in the field.

Conclusion

Rene Krenz-Baath's contributions to microchip technology through her patents and collaborations highlight her role as an influential inventor. Her innovative approaches to testing structures continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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