The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2022
Filed:
Sep. 14, 2018
Applicant:
Hochschule Hamm-lippstadt, Hamm, DE;
Inventor:
Rene Krenz-Baath, Hamm, DE;
Assignee:
Hochschule Hamm-Lippstadt, Hamm, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G01R 31/3181 (2006.01); G01R 31/3183 (2006.01); G06F 11/22 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318563 (2013.01); G01R 31/31813 (2013.01); G01R 31/318335 (2013.01); G06F 11/2205 (2013.01); G11C 29/56 (2013.01);
Abstract
The invention relates to a microchip with a multiplicity of reconfigurable test structures, wherein the microchip has a test input (TDI) and a test output (TDO), wherein the multiplicity of test structures can be connected to the test input (TDI) and the test output (TDO), wherein one intermediate memory is provided for each of the multiplicity of test structures, wherein each of the multiplicity of test structures can be tested separately and concurrently with the aid of the respective intermediate memory and a corresponding individual control.