Chandler, AZ, United States of America

Randy Neaman Siade


Average Co-Inventor Count = 4.8

ph-index = 3

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 2005-2008

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4 patents (USPTO):Explore Patents

Title: Innovations by Randy Neaman Siade

Introduction

Randy Neaman Siade is an accomplished inventor based in Chandler, AZ, with a notable portfolio of four patents. His work primarily focuses on advancements in the testing and handling of integrated circuits (ICs), showcasing his expertise in the field of electronics.

Latest Patents

One of his latest patents is a method of automatically carrying IC-chips on a planar array of vacuum nozzles to a variable target in a chip tester. This innovative method utilizes a set of laser distance sensors to align the vacuum nozzles with the target, ensuring precise placement through the sensing of specific combinations of distance and distance changes. Another significant patent is for a system designed for testing one or more groups of IC-chips while concurrently loading and unloading another group. This electromechanical system includes multiple chip holding subassemblies, each equipped with sockets for holding groups of IC-modules. The system features a moving mechanism that automatically transitions the chip holding subassemblies between load and test positions, while a temperature control mechanism ensures optimal conditions during testing.

Career Highlights

Throughout his career, Randy has worked with prominent companies such as Unisys Corporation and Delta Design, Inc. His experience in these organizations has contributed to his innovative approach to IC testing and handling.

Collaborations

Randy has collaborated with notable individuals in the industry, including James Mason Brafford and Terry Sinclair Connacher. Their combined expertise has likely influenced his inventive processes and outcomes.

Conclusion

Randy Neaman Siade's contributions to the field of electronics through his patents reflect his dedication to innovation and improvement in IC testing methodologies. His work continues to impact the industry positively.

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