The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 21, 2005
Filed:
Nov. 10, 2003
Randy Neaman Siade, Chandler, AZ (US);
Terry Sinclair Connacher, Scottsdale, AZ (US);
James Vernon Rhodes, Chandler, AZ (US);
James Mason Brafford, Mission Viejo, CA (US);
John Charles Montgomery, Poway, CA (US);
David Jon Mortensen, Mission Viejo, CA (US);
Randy Neaman Siade, Chandler, AZ (US);
Terry Sinclair Connacher, Scottsdale, AZ (US);
James Vernon Rhodes, Chandler, AZ (US);
James Mason Brafford, Mission Viejo, CA (US);
John Charles Montgomery, Poway, CA (US);
David Jon Mortensen, Mission Viejo, CA (US);
Unisys Corporation, Blue Bell, PA (US);
Abstract
An electromechanical system for testing IC-chips includes a total of N chip holding subassemblies; a moving mechanism for automatically moving the i-th chip holding subassembly from a load position in the system to the test position in the systems, and visa-versa, where i ranges from 1 to N and changes with time in a sequence; and a signal generator which sends test signals to the IC-chips at the test position. Between the moving of the i-th chip holding subassembly and the next subassembly in the sequence, test signals are sent to the IC-chips on all N of the chip holding subassemblies such that the signals are shifted in time from one subassembly to another. Also, while the i-th chip holding subassembly is being moved, the time shifted test signals continue to be sent to the IC-chips on the remaining N−1 chip holding subassemblies.