Rajiv Roy

Title: Rajiv Roy: Innovator in Semiconductor Inspection Technologies

Introduction

Rajiv Roy is a prominent inventor based in Plano, Texas, known for his significant contributions to semiconductor inspection technologies. With a total of eight patents to his name, he has made remarkable advancements in the field, particularly in systems designed for inspecting silicon wafers.

Latest Patents

Among his latest patents is a "System and method for inspecting bumped wafers." This innovative system provides a two-dimensional inspection mechanism capable of locating features such as bump contacts on a die formed on a silicon wafer. It generates feature coordinate data and is complemented by a three-dimensional inspection system that utilizes this data to produce inspection control data. Another notable patent is the "System and method for selection of a reference die." This system includes a die image comparator that analyzes differences between die images to determine the suitability of reference die images for visual inspection systems.

Career Highlights

Rajiv Roy has worked with notable companies in the semiconductor industry, including Semiconductor Technologies & Instruments Pte. Ltd. and Texas Instruments Corporation. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to the advancement of semiconductor technologies.

Collaborations

Throughout his career, Rajiv has collaborated with talented individuals such as Weerakiat Wahawisan and Charles K. Harris. These collaborations have fostered an environment of innovation and creativity, leading to the development of cutting-edge technologies in the semiconductor field.

Conclusion

Rajiv Roy's contributions to semiconductor inspection technologies through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence advancements in the field, showcasing the importance of innovation in technology.